Sulphurization of single-phase Cu 11In 9 precursors for CuInS 2 solar cells

• Published in: Thin solid films Vol. 515; no. 15; pp. 5921 - 5924
• Main Authors: Joswig, A., Gossla, M., Metzner, H., Reislöhner, U., Hahn, Th, Witthuhn, W.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 2007
• Subjects: CuInS 2; Rutherford backscattering; Sulphurization; Sulphurization; Rutherford backscattering; CuInS 2
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2006.12.053

Using Rutherford backscattering (RBS), X-ray diffraction (XRD), and scanning electron microscopy (SEM), the sulphurization of single-phase Cu 11In 9 precursors to be employed as light absorbing CuInS 2 (CIS) layers in CIS–CdS heterojunction thin-film solar cells has been investigated. The Cu 11In 9 precursor films were produced by DC-sputtering from a single-phase Cu 11In 9 target. The sulphurization at 500 or 300 °C was performed by adding different amounts of elemental sulphur with heating rate and sulphurization time as additional parameters. During sulphurization at 500 °C, up to 50% of the indium initially present in the precursor is lost. We relate the In-loss to the volatile In 2S compound, the formation of which is favoured by the phase transition of Cu 11In 9 to Cu 16In 9 at 307 °C. Consequently, the In-loss can be suppressed by employing a sulphurization temperature of 300 °C. At this temperature, a prolonged sulphurization time and a large sulphur excess are necessary in order to obtain stoichiometric CIS beneath a CuS x surface phase.