Construction of magnetization reversals of ring and square thin films of Ni 80Fe 20 using magnetic force microscopy

• Published in: Surface science Vol. 601; no. 18; pp. 4279 - 4282
• Main Authors: You, Cheng-Liang, Wu, Sheng Yun, Ma, Yuan-Ron, Yu, Chwen, Chen, Dong-Cheng, Liou, Yung, Yao, Yeong Der
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 2007
• Subjects: Atomic force microscopy; Magnetic force microscopy; Magnetic phenomena; Magnetic thin films; Ni 80Fe 20 permalloy; Atomic force microscopy; Ni 80Fe 20 permalloy; Magnetic phenomena; Magnetic force microscopy; Magnetic thin films
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/j.susc.2007.04.117

Submicron ring and square thin films of Ni 80Fe 20 were employed to investigate their magnetization reversals by using magnetic force microscopy (MFM) with a modulus of oscillation amplitude and phase shift. Statistical hysteresis loops of magnetization reversals and magnetic transitions in ring and square thin films of Ni 80Fe 20 are constructed by averaging the enhanced MFM image contrasts of selected corner areas of the thin films. The hysteresis results demonstrate that the ring thin films of Ni 80Fe 20 have only two magnetic states, which are fewer than the square thin films of Ni 80Fe 20.