Microstructure of MgB 2 thin film deposited on r-plane sapphire substrate by co-evaporation method
The microstructural features of MgB 2 thin film deposited by co-evaporation method have been investigated by transmission electron microscopy (TEM). MgB 2 thin films were deposited on r-plane sapphire substrate. The critical temperature of this film was measured to be ∼28 K with Δ T c of about 5 K....
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Published in | Physica. C, Superconductivity Vol. 469; no. 15; pp. 1571 - 1573 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
2009
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Subjects | |
Online Access | Get full text |
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Summary: | The microstructural features of MgB
2 thin film deposited by co-evaporation method have been investigated by transmission electron microscopy (TEM). MgB
2 thin films were deposited on
r-plane sapphire substrate. The critical temperature of this film was measured to be ∼28
K with Δ
T
c
of about 5
K. XRD data reveal that MgO is the major second-phase in MgB
2 film. The surface morphologies have been observed by scanning electron microscopy (SEM) and atomic force microscopy (AFM). Cross-sectional TEM images also showed that the MgB
2 thin films deposited on
r-plane sapphire substrate contained secondary phase such as MgO. Besides, according to the results of selected-area electron diffraction (SAD) patterns and high-resolution TEM (HRTEM) images, the MgB
2 thin films deposited on the
r-plane sapphire substrate comprised minor amount of the amorphous phase regions. The structural features of second-phase such as MgO and amorphous phase, crystal orientation across the interface, and defects in the cross-sectional direction were characterized with STEM-EDS and HRTEM. The correlation between superconducting properties and the MgB
2 thin films microstructures are briefly discussed. |
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ISSN: | 0921-4534 1873-2143 |
DOI: | 10.1016/j.physc.2009.05.221 |