Microstructural and chemical analysis performed by HRTEM and EDS on YBa 2Cu 3O 7− x /Ag films irradiated with electrons

• Published in: Materials science & engineering. B, Solid-state materials for advanced technology Vol. 126; no. 1; pp. 28 - 32
• Main Authors: Galván, D.H., Hirata, G.A., Adem, E.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 2006
• Subjects: Energy dispersive spectroscopy; High resolution TEM; Superconductivity; High resolution TEM; Energy dispersive spectroscopy; Superconductivity
• ISSN: 0921-5107; 1873-4944
• DOI: 10.1016/j.mseb.2005.07.028

In this work, we have performed a high resolution transmission electron microscopy and chemical analyses by energy dispersive spectroscopy (EDS) on unirradiated and electron irradiated YBa 2Cu 3O 7− x /Ag superconductor thick films and found that due to the preparation method, the following phases could coexist: YBa 2Cu 3O (7− x) (YBCO), YBa 2Cu 4O 8 and YBa 2Cu 4O 10− x . These results could be corroborated by the HRTEM analyses performed in several areas of the material. The analysis reveal that the Ag added to the material, is located mainly at the interface between the YBCO crystals. One very important aspect of the electron-irradiated samples, with which the samples were subject, is the creation of many defects scattered randomly through out the material. These defects, mainly as bending planes promote stacking faults and are presumably responsible of the enhancement of the inter grain density current, as supporting results reported previously.