Photoinduced KL 23L 23 Auger transitions in Ge thin films

Ge KL 23L 23 Auger spectra photoexcited (using bremsstrahlung radiation) from thin Ge films were measured with high energy resolution. The measured spectra were corrected for effects of inelastic electron scattering within the films, using two different models for estimating inelastic backgrounds. F...

Full description

Saved in:
Bibliographic Details
Published inJournal of electron spectroscopy and related phenomena Vol. 159; no. 1; pp. 8 - 13
Main Authors Kövér, L., Egri, S., Berényi, Z., Tóth, J., Cserny, I., Varga, D.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 2007
Subjects
Auger spectra
Electron scattering
Ge KLL
Photoexcitation
Relative intensity
Thin film
Transition energy
Electron scattering
Auger spectra
Transition energy
Relative intensity
Ge KLL
Photoexcitation
Thin film
Online AccessGet full text

Cover

More Information
Summary:Ge KL 23L 23 Auger spectra photoexcited (using bremsstrahlung radiation) from thin Ge films were measured with high energy resolution. The measured spectra were corrected for effects of inelastic electron scattering within the films, using two different models for estimating inelastic backgrounds. From the corrected Auger spectra the relative transition energies, the relative intensities and the energy widths of the KL 23L 23 Auger lines were evaluated and compared to earlier results obtained from X-ray induced Auger spectra, from Auger spectra emitted from radioactive isotopes and from Auger spectra induced by high energy electrons transmitted through ultrathin Ge layers.
ISSN:0368-2048
1873-2526
DOI:10.1016/j.elspec.2007.02.009