Quantitative, nanoscale mapping of sp 2 percentage and crystal orientation in carbon multilayers

Experimental and analytical techniques are introduced for the quantitative, nanoscale mapping of chemical bonding information in carbon-based materials. With these techniques, the spatial orientation of graphitic crystallites in tetrahedrally bonded amorphous carbon was imaged. Simultaneously, the p...

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Bibliographic Details
Published inCarbon (New York) Vol. 47; no. 1; pp. 94 - 101
Main Authors Bosman, M., Keast, V.J., Watanabe, M., McCulloch, D.G., Shakerzadeh, M., Teo, E.H.T., Tay, B.K.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 2009
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Summary:Experimental and analytical techniques are introduced for the quantitative, nanoscale mapping of chemical bonding information in carbon-based materials. With these techniques, the spatial orientation of graphitic crystallites in tetrahedrally bonded amorphous carbon was imaged. Simultaneously, the percentage of sp 2- and sp 3-bonded carbon could be mapped quantitatively, all with spatial resolution of just a few nanometers. Two electron energy-loss spectroscopy (EELS) techniques were compared: low-loss mapping of the plasmon energy and core-loss mapping of the carbon ionization edge. The recently developed EELS acquisition routine of binned gain averaging was applied, together with multivariate statistical analysis, providing a robust method for obtaining real-space, two-dimensional bonding maps.
ISSN:0008-6223
1873-3891
DOI:10.1016/j.carbon.2008.09.033