Mechanisms of cation defect formation in epitaxial YBa 2Cu 3O 7− x films

Errors inherent in electron probe microanalysis of YBa 2Cu 3O 7 films and the atomic composition of films with a resolution of 2 μm have been found. Critical temperature values have been determined from the temperature dependence of the electron beam induced voltage (EBIV). Having plotted these resu...

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Bibliographic Details
Published inPhysica. C, Superconductivity Vol. 280; no. 3; pp. 121 - 136
Main Authors Bert, N.A., Lunev, A.V., Musikhin, Yu.G., Suris, R.A., Tret'yakov, V.V., Bobyl, A.V., Karmanenko, S.F., Dedoborez, A.I.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 1997
Subjects
Cation defects
Electron microanalysis
Local critical temperature
Triple phase diagram
Local critical temperature
Electron microanalysis
Cation defects
Triple phase diagram
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Summary:Errors inherent in electron probe microanalysis of YBa 2Cu 3O 7 films and the atomic composition of films with a resolution of 2 μm have been found. Critical temperature values have been determined from the temperature dependence of the electron beam induced voltage (EBIV). Having plotted these results on a triple phase diagram of oxides, we found two tie lines with highest T c (ridges) and two tie lines with lowest T c (valleys). A mechanism of cation defect formation was proposed which accounts for the presence of this topology. The mechanism was verified by reconstructing cation defects observed in TEM images.
ISSN:0921-4534
1873-2143
DOI:10.1016/S0921-4534(97)00112-3