Investigation of the crystal structure of URu 2Si 2 by high-resolution X-ray diffraction

We report thermal expansion measurements on URu 2Si 2 by high-resolution X-ray diffraction done with a relative longitudinal resolution of 3×10 −6. Besides the abnormal thermal expansion, no lattice distortion indicating a transition into another space group was observed, i.e. the crystal remains te...

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Bibliographic Details
Published inPhysica. B, Condensed matter Vol. 259; pp. 648 - 649
Main Authors Kernavanois, N., de Réotier, P.Dalmas, Yaouanc, A., Sanchez, J.-P., Liß, K.D., Lejay, P.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 1999
Subjects
Heavy fermion
Magnetism
Supraconductivity
X-ray diffraction
Supraconductivity
X-ray diffraction
Magnetism
Heavy fermion
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Summary:We report thermal expansion measurements on URu 2Si 2 by high-resolution X-ray diffraction done with a relative longitudinal resolution of 3×10 −6. Besides the abnormal thermal expansion, no lattice distortion indicating a transition into another space group was observed, i.e. the crystal remains tetragonal down to 3 K.
ISSN:0921-4526
1873-2135
DOI:10.1016/S0921-4526(98)01005-9