SRPES studies of the NO 2 reaction with vanadium oxide thin films on TiO 2(1 1 0)-1×1

Synchrotron-radiation-induced photoelectron spectroscopy (SRPES) has been used to investigate the reaction of NO 2 over vanadia thin films at different coverages on TiO 2(1 1 0)-1×1. The stoichiometry and structure of the vanadia films are controlled to be VO 2, rutile structured, using a previously...

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Bibliographic Details
Published inSurface science Vol. 505; pp. 71 - 80
Main Authors Chang, Zhipeng, Li, Zheshen, Udby, Linda, He, Jun, Nielsen, Trine V., Møller, Preben J.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 2002
Subjects
Photoelectron spectroscopy
Single crystal epitaxy
Surface structure, morphology, roughness, and topography
Titanium oxide
Vanadium
Vanadium oxide
Single crystal epitaxy
Vanadium
Vanadium oxide
Surface structure, morphology, roughness, and topography
Titanium oxide
Photoelectron spectroscopy
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Summary:Synchrotron-radiation-induced photoelectron spectroscopy (SRPES) has been used to investigate the reaction of NO 2 over vanadia thin films at different coverages on TiO 2(1 1 0)-1×1. The stoichiometry and structure of the vanadia films are controlled to be VO 2, rutile structured, using a previously published non-dioxygen-ambient method of synthesis in UHV. The reactivity of these VO 2 films towards NO 2 varies with their coverages. The results are interpreted with regard to the surface structure and stoichiometry.
ISSN:0039-6028
1879-2758
DOI:10.1016/S0039-6028(02)01067-1