Nonlinear reflection ellipsmetry for an anisotropic uniaxial crystal then optical axis lies in the plane of incidence

A new method of ellipsometry was considered Nonlinear ellipsometry, allowing to determine nonlinear characteristic of a medium. Angular spectra of nonlinear reflection ellipsometry for uniaxial crystals such as Beta-Barium Borate, Lithium Niobate, Proustite were calculated and plotted at different o...

Full description

Saved in:
Bibliographic Details
Published inФизика волновых процессов и радиотехнические системы Vol. 16; no. 1; pp. 47 - 52
Main Authors N.A. Matveeva, R.V. Schelokov, V.V. Yatsishen
Format Journal Article
LanguageEnglish
Published Povolzhskiy State University of Telecommunications & Informatics 01.01.2013
Subjects
anisotropic uniaxial crystal
nonlinear ellipsometry
nonlinear optics
the second harmonic
Online AccessGet full text

Cover

More Information
Summary:A new method of ellipsometry was considered Nonlinear ellipsometry, allowing to determine nonlinear characteristic of a medium. Angular spectra of nonlinear reflection ellipsometry for uniaxial crystals such as Beta-Barium Borate, Lithium Niobate, Proustite were calculated and plotted at different orientations of the optical axis. Also the high sensitivity of method in the diagnosis of the crystal parameters was showed.
ISSN:1810-3189
2782-294X