Efficient Multi-Change Point Analysis to Decode Economic Crisis Information from the S P500 Mean Market Correlation
Identifying macroeconomic events that are responsible for dramatic changes of economy is of particular relevance to understanding the overall economic dynamics. We introduce an open-source available efficient Python implementation of a Bayesian multi-trend change point analysis, which solves signifi...
Saved in:
Published in | Entropy (Basel, Switzerland) Vol. 25; no. 9; p. 1265 |
---|---|
Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
MDPI AG
01.08.2023
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Identifying macroeconomic events that are responsible for dramatic changes of economy is of particular relevance to understanding the overall economic dynamics. We introduce an open-source available efficient Python implementation of a Bayesian multi-trend change point analysis, which solves significant memory and computing time limitations to extract crisis information from a correlation metric. Therefore, we focus on the recently investigated S&P500 mean market correlation in a period of roughly 20 years that includes the dot-com bubble, the global financial crisis, and the Euro crisis. The analysis is performed two-fold: first, in retrospect on the whole dataset and second, in an online adaptive manner in pre-crisis segments. The online sensitivity horizon is roughly determined to be 80 up to 100 trading days after a crisis onset. A detailed comparison to global economic events supports the interpretation of the mean market correlation as an informative macroeconomic measure by a rather good agreement of change point distributions and major crisis events. Furthermore, the results hint at the importance of the U.S. housing bubble as a trigger of the global financial crisis, provide new evidence for the general reasoning of locally (meta)stable economic states, and could work as a comparative impact rating of specific economic events. |
---|---|
ISSN: | 1099-4300 |
DOI: | 10.3390/e25091265 |