RELIABILITY BIVARIATE ANALYSIS BASED ON COPULAS ANÁLISIS BIVARIADO DE CONFIABILIDAD BASADO EN CÓPULAS

In industry, reliability studies are done to assure the quality level of products manufactured. Sometimes these products have several failure modes that must be considered in reliability analysis. This analysis is complicated when the dependence pattern is included. In this article a reliability ana...

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Bibliographic Details
Published inRevista Colombiana de Estadística Vol. 34; no. 2; pp. 267 - 285
Main Authors Monjardin Pedro Enrique, Villa-Diharce Enrique Raúl
Format Journal Article
LanguageEnglish
Published Universidad Nacional de Colombia 01.08.2011
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Summary:In industry, reliability studies are done to assure the quality level of products manufactured. Sometimes these products have several failure modes that must be considered in reliability analysis. This analysis is complicated when the dependence pattern is included. In this article a reliability analysis of components that have two dependent failure modes is proposed. The dependence pattern is expressed through a copula function, this representation is appropriate, because the marginal distributions of failure times are from different families, Lognormal and Weibull. We provide an example which illustrates the reliability analysis of components with two failure modes.En la industria se requieren estudios de confiabilidad para asegurar el nivel de calidad de los productos que se fabrican. Algunas veces tales productos tienen varios modos de falla que deben considerarse en el análisis de confiabilidad. Este análisis se complica cuando se incluye el patrón de dependencia de los modos de falla. En este artículo se muestra el análisis de confiabilidad de componentes que presentan dos modos de falla dependientes, expresando el patrón de dependencia de ambos modos de falla por medio de una función de cópula. Esta representación es adecuada, debido a que las distribuciones de los tiempos de falla son diferentes, Lognormal y Weibull. Se presenta un ejemplo donde se ilustra el análisis de confiabilidad de componentes con dos modos de falla.
ISSN:0120-1751