Surface structural analysis of SrF 2 (111) using low-energy atom scattering spectroscopy

Abstract We studied the surface structure of SrF 2 (111) using low-energy atom scattering spectroscopy. For the spectroscopy, we used pulsed 3 keV 4 He° and 3 keV 20 Ne 0 beams as incident particles and detected 180° backscattered particles using a microchannel plate. We compared the experimental re...

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 63; no. 2; p. 25505
Main Authors Fukuta, Hiroaki, Tan, Goon, Oga, Tomoaki, Matsuda, Akifumi, Yoshimoto, Mamoru, Matsuura, Hiroto, Umezawa, Kenji
Format Journal Article
LanguageEnglish
Published 29.02.2024
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Summary:Abstract We studied the surface structure of SrF 2 (111) using low-energy atom scattering spectroscopy. For the spectroscopy, we used pulsed 3 keV 4 He° and 3 keV 20 Ne 0 beams as incident particles and detected 180° backscattered particles using a microchannel plate. We compared the experimental results with simulations employing three types of surface atomic structural models: F–Sr–F, Sr–F–F, and F–F–Sr Our results demonstrate that the topmost layer of SrF 2 (111) has approximately 60% and 40% of F–Sr–F and Sr–F–F, respectively.
ISSN:0021-4922
1347-4065
DOI:10.35848/1347-4065/ad226f