An Optimization Method for Test-Point of Analog Circuit Based on Fault Dictionary and the Branch and Bound

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Bibliographic Details
Published inJournal of Sensor Technology and Application Vol. 2; no. 3; pp. 19 - 24
Main Author 杜, 敏杰
Format Journal Article
LanguageEnglish
Published 2014
Online AccessGet full text
ISSN2331-0235
2331-0243
DOI10.12677/JSTA.2014.23004

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ISSN:2331-0235
2331-0243
DOI:10.12677/JSTA.2014.23004