Reliability Implications of NBTI in Digital Integrated Circuits

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Bibliographic Details
Published inIEEE design and test p. 1
Main Authors Park, Sang Phill, Kang, Kunhyuk, Roy, Kaushik
Format Magazine Article
LanguageEnglish
Published 2013
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ISSN:2168-2356
2168-2364
DOI:10.1109/MDT.2009.133