Performance and Scalability of Strain Engineered 2D MoTe 2 Phase-Change Memristors

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Bibliographic Details
Published inIEEE journal of the Electron Devices Society Vol. 13; pp. 343 - 349
Main Authors Guimaraes Leal, Maria Vitoria, Azizimanesh, Ahmad, Hasan, Nazmul, Wu, Stephen M.
Format Journal Article
LanguageEnglish
Published 2025
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ISSN:2168-6734
2168-6734
DOI:10.1109/JEDS.2025.3556316