Atomically ordered (Mn,Ga)As crystallites on and within GaAs Dedicated to Professor Joachim Bohm on the occasion of his 80 th birthday

Metal organic vapor phase epitaxy (MOVPE) of Mn‐rich (Mn,Ga)As on (001) oriented GaAs wafers resulted in atomically ordered (Mn,Ga)As crystallites of two morphological kinds, partially embedded on the wafer surface and fully embedded within the single crystalline matrix. While the former were appare...

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Published inCrystal research and technology (1979) Vol. 50; no. 12; pp. 967 - 973
Main Authors Häusler, Ines, Moeck, Peter, Volz, Kerstin, Neumann, Wolfgang
Format Journal Article
LanguageEnglish
Published 01.12.2015
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Summary:Metal organic vapor phase epitaxy (MOVPE) of Mn‐rich (Mn,Ga)As on (001) oriented GaAs wafers resulted in atomically ordered (Mn,Ga)As crystallites of two morphological kinds, partially embedded on the wafer surface and fully embedded within the single crystalline matrix. While the former were apparently free of defects (other than unavoidable point defects), the latter contained two domains separated by a grain boundary. Since atomic ordering can be modeled by space group symmetry descent considerations (Bärnighausen trees) that start with the space group of the known crystallographic phases of random (Mn,Ga)As alloys with specified chemical compositions, reasonable structure hypotheses have been derived for two atomically ordered Mn 0.75 Ga 0.25 As phases that we call the trigonal α' and the monoclinic β' phases. The implications of these structure hypotheses are in agreement with the results of a range of scanning transmission electron microscopy (STEM) and parallel illumination electron diffraction (ED) studies that include quantitative energy dispersive X‐ray spectroscopy, X‐ray spectroscopic imaging, as well nanobeam diffraction and high angle precession ED. The coexistence of two domains within the fully embedded crystallites is predicted by the corresponding Bärnighausen tree and observed experimentally for the fully embedded crystallites.
ISSN:0232-1300
1521-4079
DOI:10.1002/crat.201500310