Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time

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Bibliographic Details
Published in	Angewandte Chemie Vol. 125; no. 40; pp. 10735 - 10738
Main Authors	Thakuria, Ranjit, Eddleston, Mark D., Chow, Ernest H. H., Lloyd, Gareth O., Aldous, Barry J., Krzyzaniak, Joseph F., Bond, Andrew D., Jones, William
Format	Journal Article
Language	German
Published	27.09.2013
Online Access	Get full text

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ISSN:	0044-8249 1521-3757
DOI:	10.1002/ange.201302532