Exchange bias on polycrystalline BiFeO3/CO2Fe(Al0.5Si0.5)heterostructures

Polycrystalline antiferromagnetic BiFeO3 (BFO)thin films were grown on Si/SiO2/Ti/Pt (111) substrates bypulsed laser deposition and then ferromagnetic filmsCO2Fe(Al0.5Si0.5) (CFAS) by magnetron sputtering. Afterfabrication, the films were vacuum-annealed under a 0.1-Tmagnetic field at different temp...

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Bibliographic Details
Published in稀有金属:英文版 Vol. 36; no. 1; pp. 32 - 36
Main Author Shi-Zhe Wu Yong Wu Shao-Qian Yin Xiao-Guang Xu Jun Miao Yong Jiang
Format Journal Article
LanguageEnglish
Published 2017
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Summary:Polycrystalline antiferromagnetic BiFeO3 (BFO)thin films were grown on Si/SiO2/Ti/Pt (111) substrates bypulsed laser deposition and then ferromagnetic filmsCO2Fe(Al0.5Si0.5) (CFAS) by magnetron sputtering. Afterfabrication, the films were vacuum-annealed under a 0.1-Tmagnetic field at different temperatures from 150 to 500 ℃.The exchange bias field can be tuned by the annealing tem-perature for the heterostructures, and the electric domain sizecan be controlled by the crystal grain size. A large exchangebias of about 5 × 10^3 T is observed in one of the samples. Itcan be speculated that the crystal grain sizes are the key ele-ment in determining the exchange bias and coercivity of thefilms annealed at the temperature of higher than Neel tem-perature (TN) of BFO. Furthermore, it is possible to extendspin theories from single-crystal BFO system to polycrys-talline BFO system.
Bibliography:11-2112/TF
ISSN:1001-0521
1867-7185