Structure and Magnetic Properties of the γ'-FeaN Films on Cu Underlayers

The γ'-Fe4N films on Cu underlayers are deposited on the glass and Si substrates by dc magnetron reactive sputtering. The effects of Cu underlayer on the structure, morphology and magnetic properties of the γ'-Fe4N films are studied. The single-phase γ'-Fe4N films with Cu underlayers on the glass su...

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Published in中国物理快报:英文版 no. 8; pp. 148 - 151
Main Author 江凤仙 赵烨 周国伟 张君 范九萍 许小红
Format Journal Article
LanguageEnglish
Published 2015
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Summary:The γ'-Fe4N films on Cu underlayers are deposited on the glass and Si substrates by dc magnetron reactive sputtering. The effects of Cu underlayer on the structure, morphology and magnetic properties of the γ'-Fe4N films are studied. The single-phase γ'-Fe4N films with Cu underlayers on the glass substrate are obtained, while the mixture of Fe and γ'-Fe4N is observed on the Si substrate. In comparison with the films without Cu underlayers, the grains of the films with Cu underlayers exhibit a non-uniform size distribution and give rise to a rougher surface. The magnetic measurements indicate that the γ'-Fe4N films show a good soft ferromagnetic behavior. The enhanced coercivity in the films with Cu underlayers is observed due to the deterioration of the crystallographic structure as well as the rougher surface.
Bibliography:The γ'-Fe4N films on Cu underlayers are deposited on the glass and Si substrates by dc magnetron reactive sputtering. The effects of Cu underlayer on the structure, morphology and magnetic properties of the γ'-Fe4N films are studied. The single-phase γ'-Fe4N films with Cu underlayers on the glass substrate are obtained, while the mixture of Fe and γ'-Fe4N is observed on the Si substrate. In comparison with the films without Cu underlayers, the grains of the films with Cu underlayers exhibit a non-uniform size distribution and give rise to a rougher surface. The magnetic measurements indicate that the γ'-Fe4N films show a good soft ferromagnetic behavior. The enhanced coercivity in the films with Cu underlayers is observed due to the deterioration of the crystallographic structure as well as the rougher surface.
11-1959/O4
JIANG Feng-Xian, ZHAO Ye, ZHOU Guo-Wei, ZHANG Jun, FAN Jiu-Ping, XU Xiao-Hong(Key Laboratory of Magnetic Molecules and Magnetic Information Material (Ministry of Education) School of Chemistry and Materials Science, Shanxi Normal University, Linfen 041004)
ISSN:0256-307X
1741-3540