先进的电子断层扫描技术在材料科学中的发展——基于透射电子显微镜和扫描透射电子显微镜

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Bibliographic Details
Published in中国有色金属学报：英文版 Vol. 24; no. 10; pp. 3031 - 3050
Main Author 李茂华 杨延清 黄斌 罗贤 张伟 韩明 汝继刚
Format Journal Article
LanguageEnglish
Published 2014
Subjects
扫描透射电子显微镜
材料科学
电子断层扫描技术
透射电子显微镜
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Bibliography:Mao-hua LI,Yan-qing YANG,Bin HUANG,Xian LUO,Wei ZHANG,Ming HAN,Ji-gang RU（1. State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi＇an 710072, China; 2. Beijing Institute of Aeronautical Materials, Beijing 100095, China）
43-1239/TG
electron tomography;materials science;transmission electron microscopy;scanning transmission electron microscopy
The recent developments of electron tomography（ET） based on transmission electron microscopy（TEM） and scanning transmission electron microscopy（STEM） in the field of materials science were introduced. The various types of ET based on TEM as well as STEM were described in detail, which included bright-field（BF）-TEM tomography, dark-field（DF）-TEM tomography, weak-beam dark-field（WBDF）-TEM tomography, annular dark-field（ADF）-TEM tomography, energy-filtered transmission electron microscopy（EFTEM） tomography, high-angle annular dark-field（HAADF）-STEM tomography, ADF-STEM tomography, incoherent bright field（IBF）-STEM tomography, electron energy loss spectroscopy（EELS）-STEM tomography and X-ray energy dispersive spectrometry（XEDS）-STEM tomography, and so on. The optimized tilt series such as dual-axis tilt tomography, on-axis tilt tomography, conical tilt tomography and equally-sloped tomography（EST） were reported. The advanced reconstruction algorithms, such as discrete algebraic reconstruction technique（DART）, compressed sensing（CS） algorithm and EST were overviewed. At last, the development tendency of ET in materials science was presented.
ISSN:1003-6326