Structure and Migration Characteristic of Heterointerfaces During the Phase Transformation from L12 to DO(22) Phase
Based on the microscopic phase-field model, the structure and migration characteristic of ordered domain interfaces formed between DO22 and L12 phase are investigated, and the atomistic mechanism of phase transformation from L12 (Ni3Al) to DO22 (Ni3V) in Ni75AlxV25-x alloys are explored, using the s...
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Published in | Journal of Wuhan University of Technology. Materials science edition no. 5; pp. 814 - 819 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
2010
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Subjects | |
Online Access | Get full text |
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Summary: | Based on the microscopic phase-field model, the structure and migration characteristic of ordered domain interfaces formed between DO22 and L12 phase are investigated, and the atomistic mechanism of phase transformation from L12 (Ni3Al) to DO22 (Ni3V) in Ni75AlxV25-x alloys are explored, using the simulated microstructure evolution pictures and the occupation probability evolution of alloy elements at the interface. The results show that five kinds of heterointerfaces are formed between DO22 and L12 phase and four of them can migrate during the phase transformation from L12 to DO22 except the interface (002)D//(001)L. The structure of interface (100)D//(200)L and interface (100)D//(200)L·^1/2[001] remain the same before and after migration, while the interface (002)D//(002)L is formed after the migration of interface (002)D//(002)L·^1/2[100] and vice versa. These two kinds of interface appear alternatively. The jump and substitute of atoms selects the optimization way to induce the migration of interface during the phase transformation, and the number of atoms needing to jump during the migration is the least among all of the possible atom jump modes. |
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Bibliography: | microscopic phase-field Ni75AlxV25-x alloy 42-1680/TB phase transformation; ordered domain interface; interface migration; microscopic phase-field; Ni75AlxV25-x alloy ordered domain interface TG139.6 interface migration phase transformation X705 |
ISSN: | 1000-2413 1993-0437 |