Nanoscale Three-Dimensional Imaging of Integrated Circuits using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer
X-ray nanotomography is a powerful tool for the characterization of nanoscale materials and structures, but is difficult to implement due to competing requirements on X-ray flux and spot size. Due to this constraint, state-of-the-art nanotomography is predominantly performed at large synchrotron fac...
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Main Authors | , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , |
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Format | Journal Article |
Language | English |
Published |
20.12.2022
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Subjects | |
Online Access | Get full text |
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Summary: | X-ray nanotomography is a powerful tool for the characterization of nanoscale
materials and structures, but is difficult to implement due to competing
requirements on X-ray flux and spot size. Due to this constraint,
state-of-the-art nanotomography is predominantly performed at large synchrotron
facilities. We present a laboratory-scale nanotomography instrument that
achieves nanoscale spatial resolution while changing the limitations of
conventional tomography tools. The instrument combines the electron beam of a
scanning electron microscope (SEM) with the precise, broadband X-ray detection
of a superconducting transition-edge sensor (TES) microcalorimeter. The
electron beam generates a highly focused X-ray spot in a metal target held
micrometers away from the sample of interest, while the TES spectrometer
isolates target photons with high signal-to-noise. This combination of a
focused X-ray spot, energy-resolved X-ray detection, and unique system geometry
enable nanoscale, element-specific X-ray imaging in a compact footprint. The
proof-of-concept for this approach to X-ray nanotomography is demonstrated by
imaging 160 nm features in three dimensions in 6 layers of a Cu-SiO2 integrated
circuit, and a path towards finer resolution and enhanced imaging capabilities
is discussed. |
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DOI: | 10.48550/arxiv.2212.10591 |