Determination of the electromechanical limits of high-performance Nb$_3$Sn Rutherford cables under transverse stress from a single-wire experiment
Phys. Rev. Research 2, 013211 (2020) The development of high-field accelerator magnets capable of providing 16 T dipolar fields is an indispensable technological breakthrough needed for the 100 TeV energy-frontier targeted by the Future Circular Collider (FCC). As these magnets will be based on Nb$_...
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Main Authors | , , , , , |
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Format | Journal Article |
Language | English |
Published |
30.09.2019
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Subjects | |
Online Access | Get full text |
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Summary: | Phys. Rev. Research 2, 013211 (2020) The development of high-field accelerator magnets capable of providing 16 T
dipolar fields is an indispensable technological breakthrough needed for the
100 TeV energy-frontier targeted by the Future Circular Collider (FCC). As
these magnets will be based on Nb$_3$Sn Rutherford cables, the degradation of
the conductor performance due to the large electro-magnetic stresses becomes a
parameter with a profound impact on the magnet design. In this work, we
investigated the stress dependence and the irreversible reduction of the
critical current under compressive transverse load in high performance
Powder-In-Tube (PIT) Nb$_3$Sn wires. Tests were performed in magnetic fields
ranging between 16 T and 19 T on wires that were resin-impregnated similarly to
the wires in the Rutherford cables of accelerator magnets. The scope was to
predict the degradation of the cable under stress from a single-wire
experiment. Interestingly, the irreversible stress limit, $\sigma_{irr}$,
defined as the stress level corresponding to a permanent reduction of the
critical current by 5$\%$ with respect to its initial value, was found to
depend on the applied magnetic field. This observation allowed us to shed light
on the mechanism dominating the irreversible reduction of the wire performance
and to compare and reconcile our results with the irreversible limits measured
on Rutherford cables, typically tested at fields below 12 T. |
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DOI: | 10.48550/arxiv.1909.13543 |