TEMPERATURE VALUE EFFECT ON h-PARAMETER IN BIREFRINGENCE FIBERS

Subject of study. The paper presents the study of temperature value effect on the h-parameter in birefringence optical fibers for different samples: fibers with an elliptical tension cladding with a double acrylate coating (250 μm in diameter), Bow-Tie fibers with a double acrylate coating (170 μm i...

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Published inNauchno-tekhnicheskiĭ vestnik informat͡s︡ionnykh tekhnologiĭ, mekhaniki i optiki Vol. 19; no. 1; p. 21
Main Authors Mukhtubayev, A B, Aksarin, S M, Kalugin, E E
Format Journal Article
LanguageRussian
Published Saint Petersburg St. Petersburg National Research University of Information Technologies, Mechanics and Optics 01.01.2019
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ISSN2226-1494
2500-0373
DOI10.17586/2226-1494-2019-19-1-21-26

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Summary:Subject of study. The paper presents the study of temperature value effect on the h-parameter in birefringence optical fibers for different samples: fibers with an elliptical tension cladding with a double acrylate coating (250 μm in diameter), Bow-Tie fibers with a double acrylate coating (170 μm in diameter). Method. The research method is based on wideband interferometry application. We used polarization scanning Michelson interferometer with the central wavelength of the optical source equal to 1575 nm and the width equal to 45 nm. The temperature was changed by thermostat up to +70 °С, and by “dry” ice down to –70 °С. Main results. It was found that the value of the h-parameter increases from ~10-7 1/m at +22 °С to ~10-3–10-4 1/m at –70 °С in the negative temperature region, while in the positive temperature region h-parameter variation is insignificant for all fiber samples. Practical relevance. The scanning Michelson interferometer can find wide application in birefringent optical fiber production for its quality analysis: the absence of local defects, control of the fiber h-parameter value and beat length. Understanding of the temperature effect on the h-parameter value in birefringent fibers used in creation of fiber-optic sensors, will expand the performance characteristics of the developed device, as well as improve its accuracy parameters.
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ISSN:2226-1494
2500-0373
DOI:10.17586/2226-1494-2019-19-1-21-26