Mobile ion-induced data retention failure in NOR flash memory cells
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Published in | IEEE transactions on device and materials reliability Vol. 1; no. 2; pp. 128 - 132 |
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Main Authors | , , , , |
Format | Magazine Article |
Language | English |
Published |
Piscataway, NJ
Intitute of Electrical and Electronics Engineers
2001
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Subjects | |
Online Access | Get full text |
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ISSN: | 1530-4388 1558-2574 |
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DOI: | 10.1109/7298.956707 |