Reliability modeling for k-out-of-n systems subject to dependent competing failure processes

• Published in: AIP conference proceedings Vol. 2516; no. 1
• Main Authors: Kalaivani, M., Kannan, R.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Melville American Institute of Physics 30.11.2022
• Subjects: Catastrophic failure analysis; Component reliability; Degradation; Mean time to failure; Reliability analysis; System reliability

A k-out-of-n system reliability is being investigated in which all components have identical characteristics and are exposed to dependent failure processes degradation and random shock stress. In this paper, we look at two competing failures are nonfatal due to gradual degradation and the sudden inc...