Reliability modeling for k-out-of-n systems subject to dependent competing failure processes

• Published in: AIP conference proceedings Vol. 2516; no. 1
• Main Authors: Kalaivani, M., Kannan, R.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Melville American Institute of Physics 30.11.2022
• Subjects: Catastrophic failure analysis; Component reliability; Degradation; Mean time to failure; Reliability analysis; System reliability
• ISSN: 0094-243X; 1551-7616
• DOI: 10.1063/5.0108564

A k-out-of-n system reliability is being investigated in which all components have identical characteristics and are exposed to dependent failure processes degradation and random shock stress. In this paper, we look at two competing failures are nonfatal due to gradual degradation and the sudden increment in the degradation caused by random shocks and catastrophic failures caused by the same shock processes. Each component can fail due to extreme shock damage or total degradation exceeds the critical thresholds. The time-to-failure for all the components are probabilistically dependent. All the components are affected by both failure processes. The failure processes are mutually dependent since any one of process can cause the component to fail. The system works if only if at least k of its n components is functioning. A numerical illustration is given to demonstrate the proposed method.