Firing-stable PassDop passivation for screen printed n-type PERL solar cells based on a-SiN sub(x):P

Rear side passivation and local back surface field formation are two of the main technological challenges for n-type PERL silicon solar cells. A promising approach is the PassDop process. This process combines a phosphorous doped passivation layer deposited on the rear side with a subsequent laser p...

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Bibliographic Details
Published inSolar energy materials and solar cells Vol. 126; pp. 96 - 100
Main Authors Steinhauser, Bernd, bin Mansoor, Muhammad, Jager, Ulrich, Benick, Jan, Hermle, Martin
Format Journal Article
LanguageEnglish
Published 01.07.2014
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Summary:Rear side passivation and local back surface field formation are two of the main technological challenges for n-type PERL silicon solar cells. A promising approach is the PassDop process. This process combines a phosphorous doped passivation layer deposited on the rear side with a subsequent laser process to create both a local contact opening as well as a local back surface field. In this paper we introduce a new layer system based on doped amorphous silicon nitride (the fPassDop process) which is able to passivate the n-type surface after a firing step as typically used for screen printed contacts. After the firing step, an effective recombination velocity < 5 cm/s can be reached with this layer. The measured sheet resistance is in the range of 60 [Omega]/sq after the laser process. In a first test the fPassDop process is applied to small area solar cells achieving a conversion efficiency of 21.3% (675 mV V sub(oc)). Additionally, we fabricated large area n-type solar cells with screen printed front side contacts achieving 20.1% efficiency and V sub(oc) of 668 mV.
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ISSN:0927-0248
DOI:10.1016/j.solmat.2014.03.047