Transmission electron microscope

- A scanning electron microscope (SEM) coupled with an ion column (FIB) machining for nano-and a gas injection system for welding For the attention of: M. president de l~universite de Rouen Cafer OZKUL (c) 2014 Al Bawaba (Albawaba.com)

Saved in:
Bibliographic Details
Published inMENA Report
Format Newsletter
LanguageEnglish
Published Camden Disco Digital Media, Inc 18.12.2014
Subjects
Contractors
Digital cameras
Electron microscopes
Energy
Kepler, Johannes
Sensors
Software
Online AccessGet full text

Cover

More Information
Summary:- A scanning electron microscope (SEM) coupled with an ion column (FIB) machining for nano-and a gas injection system for welding For the attention of: M. president de l~universite de Rouen Cafer OZKUL (c) 2014 Al Bawaba (Albawaba.com)
ISSN:2219-0112