Adversarial Bayesian Optimization for Quantifying Motion Artifact Within MRI

Subject motion during an MRI sequence can cause ghosting effects or diffuse image noise in the phase-encoding direction and hence is likely to bias findings in neuroimaging studies. Detecting motion artifacts often relies on experts visually inspecting MRIs, which is subjective and expensive. To imp...

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Bibliographic Details
Published inPredictive Intelligence in Medicine pp. 83 - 92
Main Authors Butskova, Anastasia, Juhl, Rain, Zukić, Dženan, Chaudhary, Aashish, Pohl, Kilian M., Zhao, Qingyu
Format Book Chapter
LanguageEnglish
Published Cham Springer International Publishing 25.09.2021
SeriesLecture Notes in Computer Science
Online AccessGet full text
ISBN9783030876012
3030876012
ISSN0302-9743
1611-3349
DOI10.1007/978-3-030-87602-9_8

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Summary:Subject motion during an MRI sequence can cause ghosting effects or diffuse image noise in the phase-encoding direction and hence is likely to bias findings in neuroimaging studies. Detecting motion artifacts often relies on experts visually inspecting MRIs, which is subjective and expensive. To improve this detection, we develop a framework to automatically quantify the severity of motion artifact within a brain MRI. We formulate this task as a regression problem and train the regressor from a data set of MRIs with various amounts of motion artifacts. To resolve the issue of missing fine-grained ground-truth labels (level of artifacts), we propose Adversarial Bayesian Optimization (ABO) to infer the distribution of motion parameters (i.e., rotation and translation) underlying the acquired MRI data and then inject synthetic motion artifacts sampled from that estimated distribution into motion-free MRIs. After training the regressor on the synthetic data, we applied the model to quantify the motion level in 990 MRIs collected by the National Consortium on Alcohol and Neurodevelopment in Adolescence. Results show that the motion level derived by our approach is more reliable than the traditional metric based on Entropy Focus Criterion and manually defined binary labels.
ISBN:9783030876012
3030876012
ISSN:0302-9743
1611-3349
DOI:10.1007/978-3-030-87602-9_8