Photo- and thermo-induced bandgap and volume changes in Ge-based chalcogenide films

Irreversible and reversible changes induced by illumination and/or annealing of thin Ge-AsS films are studied. Attention is paid to the volume (thickness) changes and their correlation with changes in the bandgap. The revealed dependences are compared to that obtained for obliquely deposited As(Ge)-...

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Published inJournal of materials science. Materials in electronics Vol. 14; no. 10-12; pp. 835 - 836
Main Authors ARSOVA, D, PAMUKCHIEVA, V, VATEVA, E, SKORDEVA, E
Format Conference Proceeding Journal Article
LanguageEnglish
Published Norwell, MA Springer 01.10.2003
Springer Nature B.V
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Summary:Irreversible and reversible changes induced by illumination and/or annealing of thin Ge-AsS films are studied. Attention is paid to the volume (thickness) changes and their correlation with changes in the bandgap. The revealed dependences are compared to that obtained for obliquely deposited As(Ge)-S films, and substantial differences are found.
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ISSN:0957-4522
1573-482X
DOI:10.1023/A:1026194329779