Distribution of the crystal modifications in polymorphous PbSe films revealed by microhardness measurements

• Published in: Journal of materials science Vol. 34; no. 4; pp. 795 - 799
• Main Authors: BALEVA, M, MATEEVA, E, TRIFONOVA, E. P
• Format: Journal Article
• Language: English
• Published: Heidelberg Springer 15.02.1999; Springer Nature B.V
• Subjects: Barium fluorides; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Indentation; Lead selenides; Materials science; Mechanical and acoustical properties; Microhardness; Physical properties of thin films, nonelectronic; Physics; Size effects; Structure and morphology; thickness; Substrates; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Inorganic compounds; Epitaxial layers; Lead selenides; Binary compounds; Experimental study; Fabrication property relation; Indentation; Microhardness; Substrates; Thin films; Hot wall growth; Fabrication structure relation; Electron beam evaporation; Polymorphism; Crystal structure
• ISSN: 0022-2461; 1573-4803
• DOI: 10.1023/A:1004529115175

Microhardness measurements of homogeneous and layered polymorphous PbSe films as well of the KCl and BaF2 substrates on which the films were deposited were undertaken. The interpretation of the experimental results lead to a formula describing more adequately the indentation size effect. It is also shown that an extremum in the microhardness depth profile appears whenever the indentor crosses an interface.