Online Testable Approaches in Reversible Logic

We present an overview and analysis of existing work in the design of online testable reversible logic circuits, as well as propose new approaches for the design of such circuits. We explain how previously proposed approaches are unnecessarily high in overhead and in many cases do not provide adequa...

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Bibliographic Details
Published inJournal of electronic testing Vol. 29; no. 6; pp. 763 - 778
Main Authors Nayeem, N. M., Rice, J. E.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.12.2013
Springer Nature B.V
Subjects
CAE) and Design
Circuits
Circuits and Systems
Computer-Aided Engineering (CAD
Electrical Engineering
Engineering
Remote control
Studies
United Kingdom > UK
Testable circuit
Online testing
Toffoli gates
Reversible circuit
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Summary:We present an overview and analysis of existing work in the design of online testable reversible logic circuits, as well as propose new approaches for the design of such circuits. We explain how previously proposed approaches are unnecessarily high in overhead and in many cases do not provide adequate fault coverage. Proofs of the correctness of our approaches are provided, and discussions of the advantages and disadvantages of each design approach are given. Experimental results comparing our approaches to existing work are presented as well. Both approaches that we propose have better fault coverage and significantly lower overheads than previous approaches.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
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ISSN:0923-8174
1573-0727
DOI:10.1007/s10836-013-5399-3