Growth modes and chemical-phase separation in GaP1−xNx layers grown by chemical beam epitaxy on GaP/Si(001)
We investigated the chemical beam epitaxy of GaP 1 − xN x grown on nominally ( 001 )-oriented Si substrates, as desired for the lattice-matched integration of optoelectronic devices with the standard Si technology. The growth mode and the chemical, morphological, and structural properties of samples...
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Published in | Journal of applied physics Vol. 134; no. 17 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
07.11.2023
|
Online Access | Get full text |
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Summary: | We investigated the chemical beam epitaxy of GaP
1
−
xN
x grown on nominally
(
001
)-oriented Si substrates, as desired for the lattice-matched integration of optoelectronic devices with the standard Si technology. The growth mode and the chemical, morphological, and structural properties of samples prepared using different growth temperatures and N precursor fluxes were analyzed by several techniques. Our results show that, up to
x
≈
0.04, it is possible to synthesize smooth and chemically homogeneous GaP
1
−
xN
x layers with a high structural quality. As the flux of the N precursor is increased at a given temperature to enhance N incorporation, the quality of the layers degrades upon exceeding a temperature-dependent threshold; above this threshold, the growing layer experiences a growth mode transition from 2D to 3D after reaching a critical thickness of a few nm. Following that transition, the morphology and the chemical composition become modulated along the
[
110
] direction with a period of several tens of nm. The surface morphology is then characterized by the formation of
{
113
}-faceted wires, while the N concentration is enhanced at the troughs formed in between adjacent
(
113
) and
(
1
¯
1
¯
3
). On the basis of this study, we conclude on the feasibility of fabricating homogeneous thick GaP
1
−
xN
x layers lattice matched to Si (
x
=
0.021) or even with N content up to
x
=
0.04. The possibility of exceeding a N mole fraction of 0.04 without inducing coupled morphological–compositional modulations has also been demonstrated when the layer thickness is kept below the critical value for the 2D–3D growth mode transition. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/5.0173748 |