Characterization of polymeric films by ellipsometry

• Published in: Journal of materials science letters Vol. 19; no. 8; pp. 679 - 681
• Main Authors: SVORCIK, V, TICHA, H, RYBKA, V, HNATOWICZ, V
• Format: Journal Article
• Language: English
• Published: Dordrecht Kluwer Academic Publishers 2000
• Subjects: Applied sciences; Electrical, magnetic and optical properties; Exact sciences and technology; Organic polymers; Physicochemistry of polymers; Properties and characterization; Ethylene terephthalate polymer; Polyethylene; Molecular orientation; Oriented polymer; Thick film; Optical properties; Refraction index; Styrene polymer; Property structure relationship; Measurement method; Experimental study; Ellipsometry
• ISSN: 0261-8028
• DOI: 10.1023/A:1006762728131

The present results can be summarized as follows: Directional dependence of the ellipsometric parameters Psi and Delta measured by transmission and reflection techniques disappears with increasing film thickness. From the result of the tranmission measurement of 50 mu m thick PET film (Exhibiting negligible directional dependence) we calculated n=1.87plus/minus0.22 and epsilon sub r =3.60. For PE we obtained by the same procedure n=1.43plus/minus0.16 and epsilon sub r =2.06. It was shown by the transmission ellipsometry that an initially unoriented PE exhibits, after mechanical orientation, significant directional dependence of the ellipsometric parameters Psi and Delta . PS film prepared by the deposition from a solution of initially oriented PS exhibits no directional dependence of the ellipsometric parameters Psi and Delta .