Solving Quality and Reliability Optimization Problems for MEMS with Degradation Data

This chapter contains sections titled: Abbreviations Introduction Notations and Assumptions Reliability Model Numerical Example Conclusions

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Bibliographic Details
Published inMaterials and Failures in MEMS and NEMS pp. 381 - 399
Main Authors Lundia, Yash, Jain, Kunal, Krishna, Mamanduru Vamsee, Tiwari, Manoj Kumar, Raj, Baldev
Format Book Chapter
LanguageEnglish
Published United States John Wiley & Sons, Incorporated 2015
John Wiley & Sons, Inc
Subjects
Micro‐Electro‐Mechanical Systems
Multiple Depeendent Competing Failure Process
Particle Swarm Optimization
System Reliability
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Summary:This chapter contains sections titled: Abbreviations Introduction Notations and Assumptions Reliability Model Numerical Example Conclusions
ISBN:9781119083603
1119083605
DOI:10.1002/9781119083887.ch13