DISORDER IN GexAs40-xS60 GLASSES AND FILMS: AN EXAFS STUDY

X-ray absorption spectroscopy has been used to study GexAs40-xS60 glasses and films at the K edges of As, Ge and S. The spectra obtained for glasses with different compositions as well as those for glasses and films are compared. The spectra of films before and after illumination or thermal treatmen...

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Bibliographic Details
Published inJournal of Optoelectronics and Advanced Materials Vol. 7; no. 4; pp. 1869 - 1874
Main Authors Skordeva, E, Womes, M, Lippens, P E, Jumas, J C, Arsova, D
Format Journal Article
LanguageEnglish
Published 01.08.2005
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Summary:X-ray absorption spectroscopy has been used to study GexAs40-xS60 glasses and films at the K edges of As, Ge and S. The spectra obtained for glasses with different compositions as well as those for glasses and films are compared. The spectra of films before and after illumination or thermal treatments are compared in order to study the effect of annealing and/or illumination upon the disorder. The results are discussed in terms of the degree of chemical and structural disorders of the amorphous matrices.
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ISSN:1454-4164