1.3-μm GaInAsN vertical-cavity surface-emitting lasers by oxide-planarized and surface-relief processes for single-mode operation

In this letter, we investigate and characterize the 1.3-mum single-mode vertical-cavity surface-emitting lasers (VCSELs) with two GaInAsN strained multiple quantum wells as the active region. Surface relief technique and a thick silicon oxide were used for the spatial mode filtering and the planariz...

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Published inIEEE electron device letters Vol. 28; no. 2; pp. 120 - 122
Main Authors LEE, Feng-Ming, TSAI, Chia-Lung, HU, Chih-Wei, HUANG, Kun-Fu, WU, Meng-Chyi, KO, Sun-Chien
Format Journal Article
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 01.02.2007
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Summary:In this letter, we investigate and characterize the 1.3-mum single-mode vertical-cavity surface-emitting lasers (VCSELs) with two GaInAsN strained multiple quantum wells as the active region. Surface relief technique and a thick silicon oxide were used for the spatial mode filtering and the planarization processing, respectively. The VCSELs with a 5-mum-diameter surface-relief aperture and a 12-mum-diameter oxide-confined aperture at room temperature exhibit a threshold current of 3 mA, a slope efficiency of 0.14 mW/mA, a maximum operation temperature of 90 degC, and a single-mode behavior. These VCSELs show a maximum light output power of 1 mW for the single fundamental mode with a transverse-mode suppression of more than 30 dB and also show a clear eye-opening feature operated at 2.488 Gb/s and 12.6 mA
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ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2006.889512