Comparison of Y-Ba-Cu-O Films Irradiated With Helium and Neon Ions for the Fabrication of Josephson Devices

• Published in: IEEE transactions on applied superconductivity Vol. 24; no. 4; pp. 1 - 5
• Main Authors: Cybart, Shane A, Yen, Patricia X. T, Cho, Ethan Y, Huh, Jeong Uk, Glyantsev, V. N, Yung, Christopher S, Moeckly, Brian, Beeman, Jeffrey W, Dynes, Robert C
• Format: Journal Article
• Language: English
• Published: New York The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 01.08.2014
• Subjects: COMPUTER SIMULATION; Damage; ELECTRICAL CONDUCTIVITY; Electrical resistivity; FABRICATION; HELIUM; IRRADIATION; Neon; RADIATION; SUPERCONDUCTIVITY; THIN FILMS; Transition temperature; YTTRIUM OXIDE
• ISSN: 1051-8223; 1558-2515
• DOI: 10.1109/TASC.2014.2311400

We have irradiated high-quality $\hbox{YBa}_{2}\hbox{Cu}_{3}\hbox{O}_{7-\delta}$ thin films with 90-keV helium and 175-keV neon ions to compare how ions of different mass affect electrical transport and reduce superconducting transition temperature. We measure the temperature dependence of the resistivity for films irradiated with different fluence and compare the results with Monte Carlo ion implantation simulations. We observe a smaller increase in resistivity for films irradiated with neon than those irradiated with helium for an equivalent reduction in transition temperature. We attribute this observation to nonuniform damage throughout the thickness of the film when irradiated with neon, as opposed to a more uniform damage profile in the case of helium irradiation.