The influence of implanted yttrium on the mechanism of growth of Cr2O3 on Cr
One of the apparent effects of Y on the growth of Cr2O3 scales, based on inert marker studies, is a change in growth mechanism from predominant cation diffusion to predominant anion diffusion (1-3). The interpretation of inert marker studies has always been open to question, and a recent study of th...
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Published in | Journal of the Electrochemical Society Vol. 134; no. 7; pp. 1871 - 1872 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Pennington, NJ
Electrochemical Society
01.07.1987
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Subjects | |
Online Access | Get full text |
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Summary: | One of the apparent effects of Y on the growth of Cr2O3 scales, based on inert marker studies, is a change in growth mechanism from predominant cation diffusion to predominant anion diffusion (1-3). The interpretation of inert marker studies has always been open to question, and a recent study of the mechanisms of growth of alpha-Al2O3 scales using 18O tracer techniques (4) has demonstrated that the results of inert marker studies can, indeed, be misleading. Results of 18O tracter oxidation experiments conducted with Y-implanted and Y-free Cr are reported in this paper, which demonstrate that Y implantation does change the mechanism of oxide growth. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0013-4651 1945-7111 |
DOI: | 10.1149/1.2100775 |