The influence of implanted yttrium on the mechanism of growth of Cr2O3 on Cr

One of the apparent effects of Y on the growth of Cr2O3 scales, based on inert marker studies, is a change in growth mechanism from predominant cation diffusion to predominant anion diffusion (1-3). The interpretation of inert marker studies has always been open to question, and a recent study of th...

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Published inJournal of the Electrochemical Society Vol. 134; no. 7; pp. 1871 - 1872
Main Authors COTELL, C. M, YUREK, G. J, HUSSEY, R. J, MITCHELL, D. F, GRAHAM, M. J
Format Journal Article
LanguageEnglish
Published Pennington, NJ Electrochemical Society 01.07.1987
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Summary:One of the apparent effects of Y on the growth of Cr2O3 scales, based on inert marker studies, is a change in growth mechanism from predominant cation diffusion to predominant anion diffusion (1-3). The interpretation of inert marker studies has always been open to question, and a recent study of the mechanisms of growth of alpha-Al2O3 scales using 18O tracer techniques (4) has demonstrated that the results of inert marker studies can, indeed, be misleading. Results of 18O tracter oxidation experiments conducted with Y-implanted and Y-free Cr are reported in this paper, which demonstrate that Y implantation does change the mechanism of oxide growth.
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content type line 23
ISSN:0013-4651
1945-7111
DOI:10.1149/1.2100775