Performance characteristics of 1.5-μm external cavity semiconductor lasers for coherent optical communication

The performance characteristics of 1.5- mu m external cavity semiconductor lasers have been investigated. Measurements of phase, frequency, and amplitude stability are presented together with the power and threshold characteristics. Amplitude shift keyed coherent receiver sensitivity measurements ga...

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Bibliographic Details
Published inJournal of lightwave technology Vol. 5; no. 4; pp. 510 - 515
Main Authors OLSSON, N. A, VAN DER ZIEL, J. P
Format Journal Article
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 1987
Subjects
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Lasers
Optics
Physics
Semiconductor lasers; laser diodes
External cavity
Optical telecommunication
Semiconductor laser
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Summary:The performance characteristics of 1.5- mu m external cavity semiconductor lasers have been investigated. Measurements of phase, frequency, and amplitude stability are presented together with the power and threshold characteristics. Amplitude shift keyed coherent receiver sensitivity measurements gave a receiver sensitivity of -55.7 dBm at 150 Mbit/s equivalent to 137 photon/bit as compared to previous amplitude shift keying results of 520 photon/bit and the shotnoise limit of 36 photon/bit.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.1987.1075530