Study of the Raman-AFM system for simultaneous measurements of Raman spectrum and micro/nano-structures

This paper proposes a novel technique of Raman-atomic force microscopy (AFM) combining micro region Raman spectroscopy and AFM imaging. An in-situ probe unit which can simultaneously realize the detection of Raman spectrum and the measurement of AFM image was designed, and a related Raman-AFM system...

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Bibliographic Details
Published inGuang pu xue yu guang pu fen xi Vol. 32; no. 4; p. 993
Main Authors Shi, Bin, Zhang, Hai-jun, Wu, Lan, Zhang, Dong-xian
Format Journal Article
LanguageChinese
Published China 01.04.2012
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Summary:This paper proposes a novel technique of Raman-atomic force microscopy (AFM) combining micro region Raman spectroscopy and AFM imaging. An in-situ probe unit which can simultaneously realize the detection of Raman spectrum and the measurement of AFM image was designed, and a related Raman-AFM system was constructed. Using this system, some experiments were carried out to acquire micro region Raman spectra and AFM images of ZnO nano-particle and TiO2 film. The results show that the Raman spectra of both samples are in agreement with theoretical vaues, and the AFM images represent their micro/nano-structures quite well. These researches prove the feasibility of the Raman-AFM technique which has the potential of being widely applied in the fields of Raman spectroscopy and micro/nano-technology.
ISSN:1000-0593
DOI:10.3964/j.issn.1000-0593(2012)04-0993-04