H2 defect in crystalline silicon

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Bibliographic Details
Published inPhysical review letters Vol. 71; no. 6; p. 875
Main Authors Holbech, JD, Bech Nielsen B, Jones, R, Sitch, P, Öberg, S
Format Journal Article
LanguageEnglish
Published United States 09.08.1993
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ISSN:1079-7114
DOI:10.1103/PhysRevLett.71.875