Cosmic-ray soft error rate characterization of a standard 0.6- mu m CMOS process

Cosmic-ray soft errors from ground level to aircraft flight altitudes are caused mainly by neutrons. We derived an empirical model for estimation of soft error rate (SER). Test circuits were fabricated in a standard 0.6- mu m CMOS process. The neutron SER dependence on the critical charge and supply...

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Bibliographic Details
Published inIEEE journal of solid-state circuits Vol. 35; no. 10
Main Authors Hazucha, P, Svensson, C, Wender, SA
Format Journal Article
LanguageEnglish
Published 01.10.2000
Subjects
Circuits
CMOS
Devices
Empirical analysis
Mathematical models
Soft errors
Three dimensional
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Summary:Cosmic-ray soft errors from ground level to aircraft flight altitudes are caused mainly by neutrons. We derived an empirical model for estimation of soft error rate (SER). Test circuits were fabricated in a standard 0.6- mu m CMOS process. The neutron SER dependence on the critical charge and supply voltage was measured. Time constants of the noise current were extracted from the measurements and compared with device simulations in three dimensions. The empirical model was calibrated and verified by independent SER measurements. The model is capable of predicting cosmic-ray neutron SER of any circuit manufactured in the same process as the test circuits. We predicted SER of a static memory cell
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ISSN:0018-9200
DOI:10.1109/4.871318