Higher order statistics in signal processing and nanometric size analysis
A method for the characterisation of the distribution of nanoparticles is proposed, by using the skewness and kurtosis of experimental values. The method is analysed on several examples and the different properties it presents are extracted. Further, the method is applied on nanoparticle data in ord...
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| Published in | Journal of Optoelectronics and Advanced Materials Vol. 10; no. 12; pp. 3292 - 3299 |
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| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
01.12.2008
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| Online Access | Get full text |
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| Summary: | A method for the characterisation of the distribution of nanoparticles is proposed, by using the skewness and kurtosis of experimental values. The method is analysed on several examples and the different properties it presents are extracted. Further, the method is applied on nanoparticle data in order to better characterise its distribution and to eliminate noise. |
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| Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
| ISSN: | 1454-4164 |