Differential Sensing of Substrate Noise in Mixed-Signal 0.18-μm BiCMOS Technology

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Bibliographic Details
Published inIEEE electron device letters Vol. 29; no. 8; pp. 898 - 901
Main Authors HAITAO DAI, KNEPPER, Ronald W
Format Journal Article
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 01.08.2008
Subjects
Amplifiers
Applied sciences
Circuit properties
Design. Technologies. Operation analysis. Testing
Electric, optical and optoelectronic circuits
Electrical engineering. Electrical power engineering
Electronic circuits
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Integrated circuits
Power electronics, power supplies
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
deep trench
Trench technology
Crosstalk
Measurement sensor
Differential circuit
Mixed signal circuit
Doped materials
Driver
n-well guard ring
Power electronics
BiCMOS technology
Guard ring
Complementary MOS technology
Radiofrequency amplifiers
Bipolar technology
substrate noise
Circuit noise
Capacitive coupling
Power amplifier
isolation technology
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More Information
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2008.2000842