Study of SmxZr1-xOy buffer layer and its effects on YBCO properties

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Bibliographic Details
Published inIEEE transactions on applied superconductivity Vol. 17; no. 2; pp. 3409 - 3412
Main Authors STAN, Liliana, ARENDT, Paul N, LI, Yuan L, HAIYAN WANG, FOLTYN, Stephen R, HOLESINGER, Terry G, MAIOROV, Boris, CIVALE, Leonardo, USOV, Igor O, GROVES, James R, DEPAULA, Raymond F
Format Conference Proceeding
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 01.06.2007
Subjects
Applied sciences
Electric connection. Cables. Wiring
Electrical engineering. Electrical power engineering
Electronics
Exact sciences and technology
Microelectronic fabrication (materials and surfaces technology)
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Various equipment and components
Transport properties
High density
Ion beam assisted deposition method
Texture
Sputtering
Sputter coating
Thin film
Microelectronic fabrication
Physical vapor deposition
Electrical conductor
Buffers
Cost lowering
High temperature superconductor
Buffer layer
High strength current
Critical current density
high temperature superconductors
Pulsed laser deposition
Epitaxial film
Ion beam coating
Coated material
Surface treatment
thin films
High current
Reactive sputtering
Cathodic sputtering
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ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2007.898336