Cathodoluminescence depth profiling in SiO2:Ge layers
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Published in | Mikrochimica acta (1966) Vol. 139; no. 1-4; pp. 11 - 16 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Wien
Springer
2002
New York, NY |
Subjects | |
Online Access | Get full text |
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ISSN: | 0026-3672 1436-5073 |
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DOI: | 10.1007/s006040200033 |