Sensitivity analysis for on-chip ΔI-noise simulation

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Bibliographic Details
Published inProceedings - Electronic Components Conference
Main Authors KEMMLER, Bemd, HUBER, Andreas
Format Conference Proceeding
LanguageEnglish
Published Piscataway NJ IEEE 2004
Subjects
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Sensitivity analysis
High frequency
Electronic packaging
Comparative study
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ISBN:9780780383654
0780383656
ISSN:0569-5503
2377-5726
DOI:10.1109/ECTC.2004.1320366